Effect of chromatic dispersion on image size and lattice plane curvature measurements with Rocking Curve Imaging
Abstract
ADP crystals of large dimensions (80x80x20 mm3), to be used as a X-ray beam expanders in the BEaTriX facility at INAF-OABrera, have been characterised at BM05 beamline at ESRF synchrotron with the main purpose to determine lattice plane curvature with a unprecedent accuracy, as the BEaTriX setup requires a radius of curvature larger than 22 km. In this beamline, the monochromator is made by 2 Si(111) parallel crystals in the non-dispersive configuration. Due to the difference in the Bragg angles between the Si(111) monochromator and the ADP(008) diffractions, only a limited part of the sample area, hit by the X-ray beam (11x11 mm2 cross section), produced a diffracted beam for a given value of angle of incidence. In the rocking curve imaging techniques, a full image of the sample for a given peak position is obtained by combining images taken at different angles of incidence compensated by the dispersion correction, that is the Bragg condition difference in different points of the sample. It is found that the resulting image size parallel to the scattering plane is affected by this dispersion correction. A 4.5 % elongation along the scattering plane was evaluated in the present Bragg case. This contribution is opposite in the Laue case.